X-ray diffraction evidence for epitaxial microcrystallinity in thermally oxidized SiO<sub>2</sub>thin films on the Si(001) surface
X-ray diffraction evidence for epitaxial microcrystallinity in thermally oxidized SiO<sub>2</sub>thin films on the Si(001) surface is a paper indexed in PICO Portal from OpenAlex.
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X-ray diffraction evidence for epitaxial microcrystallinity in thermally oxidized SiO<sub>2</sub>thin films on the Si(001) surface has 52 citations in the OpenAlex counts PICO Portal stores.
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X-ray diffraction evidence for epitaxial microcrystallinity in thermally oxidized SiO<sub>2</sub>thin films on the Si(001) surface has 1993 year in the PICO Portal index.
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X-ray diffraction evidence for epitaxial microcrystallinity in thermally oxidized SiO<sub>2</sub>thin films on the Si(001) surface has closed oa status in the PICO Portal index.
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