Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing
Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing is a paper indexed in PICO Portal from OpenAlex.
How many citations does Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing have?
Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing has 27 citations in the OpenAlex counts PICO Portal stores.
When was Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing published?
Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing has 2014 year in the PICO Portal index.
What is the open-access status of Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing?
Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing has closed oa status in the PICO Portal index.
What is the DOI of Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing?
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What is the OpenAlex record for Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing?
The OpenAlex for Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing is on the source record.