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Controlled chemical etching leads to efficient silicon–bismuth interface for photoelectrochemical CO2 reduction to formate

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Controlled chemical etching leads to efficient silicon–bismuth interface for photoelectrochemical CO2 reduction to formate is a paper indexed in PICO Portal from OpenAlex.

How many citations does Controlled chemical etching leads to efficient silicon–bismuth interface for photoelectrochemical CO2 reduction to formate have?

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Controlled chemical etching leads to efficient silicon–bismuth interface for photoelectrochemical CO2 reduction to formate has 41 citations in the OpenAlex counts PICO Portal stores.

When was Controlled chemical etching leads to efficient silicon–bismuth interface for photoelectrochemical CO2 reduction to formate published?

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Controlled chemical etching leads to efficient silicon–bismuth interface for photoelectrochemical CO2 reduction to formate has 2018 year in the PICO Portal index.

What is the open-access status of Controlled chemical etching leads to efficient silicon–bismuth interface for photoelectrochemical CO2 reduction to formate?

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Controlled chemical etching leads to efficient silicon–bismuth interface for photoelectrochemical CO2 reduction to formate has closed oa status in the PICO Portal index.

What is the DOI of Controlled chemical etching leads to efficient silicon–bismuth interface for photoelectrochemical CO2 reduction to formate?

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The DOI for Controlled chemical etching leads to efficient silicon–bismuth interface for photoelectrochemical CO2 reduction to formate is on the source record.

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The OpenAlex for Controlled chemical etching leads to efficient silicon–bismuth interface for photoelectrochemical CO2 reduction to formate is on the source record.

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