# A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes

**Type:** Papers  
**Canonical URL:** https://picoportal.org/library/papers/a-convolutional-neural-network-for-fault-classification-and-diagnosis-in/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Ki Bum Lee,Sejune Cheon,Chang Ouk Kim |
| Citations | 477 |
| DOI | 10.1109/tsm.2017.2676245 |
| Fields | Decision Sciences,Engineering |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W2594332903 |
| Type | article |
| Year | 2017 |

## Paper authors

- [Chang Ouk Kim](https://picoportal.org/library/researchers/chang-ouk-kim/)

## Paper journal

- [IEEE Transactions on Semiconductor Manufacturing](https://picoportal.org/library/journals/ieee-transactions-on-semiconductor-manufacturing/)

## Paper primary topic

- [Industrial Vision Systems and Defect Detection](https://picoportal.org/library/topics/industrial-vision-systems-and-defect-detection/)

## Paper topics

- [Industrial Vision Systems and Defect Detection](https://picoportal.org/library/topics/industrial-vision-systems-and-defect-detection/)
- [Fault Detection and Control Systems](https://picoportal.org/library/topics/fault-detection-and-control-systems/)
- [Advanced Statistical Process Monitoring](https://picoportal.org/library/topics/advanced-statistical-process-monitoring/)

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Source: PICO Portal — public research metadata, principally OpenAlex. See https://picoportal.org/library/sources/ for provenance and https://picoportal.org/library/methodology/ for what these figures mean.