PICO Portalanswers from OpenAlex
IEEE Transactions on Instrumentation and Measurement
JournalCitation impact & published research
IEEE Transactions on Instrumentation and Measurement is a journal indexed in PICO Portal from OpenAlex.
How many works does IEEE Transactions on Instrumentation and Measurement have?
PICO Portalindexed works
IEEE Transactions on Instrumentation and Measurement has 29,165 works in the PICO Portal index. The count is the OpenAlex total, not the number of papers listed on this page.
How many citations does IEEE Transactions on Instrumentation and Measurement have?
PICO Portalcitation count
IEEE Transactions on Instrumentation and Measurement has 560,571 citations in the OpenAlex counts PICO Portal stores.
What is the h-index of IEEE Transactions on Instrumentation and Measurement?
PICO Portalh-index
IEEE Transactions on Instrumentation and Measurement has an h-index of 198 in OpenAlex.
What is the OpenAlex record for IEEE Transactions on Instrumentation and Measurement?
PICO Portalopenalex
The OpenAlex for IEEE Transactions on Instrumentation and Measurement is on the source record.
What are the most-cited papers on IEEE Transactions on Instrumentation and Measurement?
PICO Portalmost cited works
A Novel Ultrasound Robot With Force/Torque Measurement and Control for Safe and Efficient Scanning
Xianqiang Bao, Shuangyi Wang, Lingling Zheng, R. James Housden, Joseph V. Hajnal, Kawal Rhode
DeprNet: A Deep Convolution Neural Network Framework for Detecting Depression Using EEG
Ayan Seal, Rishabh Bajpai, Jagriti Agnihotri, Anis Yazidi, Enrique Herrera‐Viedma, Ondřej Krejcar
Facial Expression Recognition Using Local Gravitational Force Descriptor-Based Deep Convolution Neural Networks
Mohan Karnati, Ayan Seal, Ondřej Krejcar, Anis Yazidi
Understanding Deep Learning Techniques for Recognition of Human Emotions Using Facial Expressions: A Comprehensive Survey
Mohan Karnati, Ayan Seal, Debotosh Bhattacharjee, Anis Yazidi, Ondřej Krejcar
Crack Shape Reconstruction in Eddy Current Testing Using Machine Learning Systems for Regression
A. Bernieri, Luigi Ferrigno, Marco Laracca, Mario Molinara