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IEE Proceedings - Science Measurement and Technology

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IEE Proceedings - Science Measurement and Technology is a journal indexed in PICO Portal from OpenAlex.

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The OpenAlex for IEE Proceedings - Science Measurement and Technology is on the source record.

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Finite-element variational formulation of the impedance boundary condition for solving eddy current problems
Aezeden Mohamed
IEE Proceedings - Science Measurement and Technology. 19955 Citations

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